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Cosmetic Defect Inspection Equipment

The Ceramic Substrate Cosmetic Defect Inspection Equipment is designed for cosmetic defect inspection of ceramic substrates used in DCB, AMB, and DPC processes.

DESCRIPTION

  • Cosmetic Defect Inspection: Performs cosmetic defect inspection for ceramic substrates used in DCB/AMB/DPC processes.
  • Defect Examples: The source shows open circuit, short circuit, copper, notch, and bubble as inspection examples.

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